Title :
A numerical analysis of transient charge partitioning
Author :
Obrecht, Michael S. ; Heasell, Edwin L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
fDate :
3/1/1996 12:00:00 AM
Abstract :
The rigorous numerical analysis of charge partitioning in a simple p-n junction structure is presented. Procedures for extracting the relevant terminal charges, based upon the concept of a “pass-through” current, are introduced. The calculation of the pass-through current, the electrostatic displacement current and the (distinct) current associated with the changes in internal charge distributions are described. Methods for dividing the various internal charges into “quasineutral” and “space-charge” components, are also presented. The results obtained by exact analysis are compared with the predictions of the conventional, analytic, charge partitioning models. Significant discrepancies are found to arise from the simplifications necessary for analytic modeling such as the dependence of the partitioning on the ramp speed and injection level and asymmetry between switch-on and switch-off transients. The numerical simulation results offer guidance for the future development of alternative, more accurate, nonquasi-static device models
Keywords :
numerical analysis; p-n junctions; semiconductor device models; space charge; transient analysis; analytic modeling; electrostatic displacement current; injection level; internal charge distributions; nonquasi-static device models; numerical analysis; numerical simulation; p-n junction structure; pass-through current; quasineutral component; ramp speed; space-charge component; switch-off transients; switch-on transients; terminal charges; transient charge partitioning; Electrostatics; Equations; Helium; Impurities; Microelectronics; Numerical analysis; Numerical simulation; P-n junctions; Predictive models; Transient analysis;
Journal_Title :
Electron Devices, IEEE Transactions on