• DocumentCode
    760976
  • Title

    A new analytical diode model including tunneling and avalanche breakdown

  • Author

    Hurkx, G.A.M. ; de Graaff, H.C. ; Kloosterman, W.J. ; Knuvers, M.P.G.

  • Author_Institution
    Philips Res. Lab., Eindhoven, Netherlands
  • Volume
    39
  • Issue
    9
  • fYear
    1992
  • fDate
    9/1/1992 12:00:00 AM
  • Firstpage
    2090
  • Lastpage
    2098
  • Abstract
    An analytical model describing reverse and forward DC characteristics is presented. It serves as a basis for a compact model for circuit simulation purposes. The model is based on the solution of the hole continuity equation in the depletion layer of a p-n junction and incorporates the following physical mechanisms: band-to-band tunneling, trap-assisted tunneling (both under forward and reverse bias), Shockley-Read-Hall recombination, and avalanche breakdown. It contains seven parameters which can be determined at one temperature. No additional parameters are needed to describe the temperature dependence. From comparisons with both numerical simulations and measurements it is found that the model gives an adequate description of the DC characteristics in both forward and reverse modes
  • Keywords
    electron-hole recombination; impact ionisation; semiconductor device models; semiconductor diodes; tunnelling; DC characteristics; Shockley-Read-Hall recombination; analytical model; avalanche breakdown; band-to-band tunneling; circuit simulation; depletion layer; diode model; forward mode; hole continuity equation; p-n junction; reverse modes; trap-assisted tunneling; Analytical models; Avalanche breakdown; Circuit simulation; Diodes; Equations; P-n junctions; SPICE; Temperature dependence; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.155882
  • Filename
    155882