DocumentCode
760976
Title
A new analytical diode model including tunneling and avalanche breakdown
Author
Hurkx, G.A.M. ; de Graaff, H.C. ; Kloosterman, W.J. ; Knuvers, M.P.G.
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
Volume
39
Issue
9
fYear
1992
fDate
9/1/1992 12:00:00 AM
Firstpage
2090
Lastpage
2098
Abstract
An analytical model describing reverse and forward DC characteristics is presented. It serves as a basis for a compact model for circuit simulation purposes. The model is based on the solution of the hole continuity equation in the depletion layer of a p-n junction and incorporates the following physical mechanisms: band-to-band tunneling, trap-assisted tunneling (both under forward and reverse bias), Shockley-Read-Hall recombination, and avalanche breakdown. It contains seven parameters which can be determined at one temperature. No additional parameters are needed to describe the temperature dependence. From comparisons with both numerical simulations and measurements it is found that the model gives an adequate description of the DC characteristics in both forward and reverse modes
Keywords
electron-hole recombination; impact ionisation; semiconductor device models; semiconductor diodes; tunnelling; DC characteristics; Shockley-Read-Hall recombination; analytical model; avalanche breakdown; band-to-band tunneling; circuit simulation; depletion layer; diode model; forward mode; hole continuity equation; p-n junction; reverse modes; trap-assisted tunneling; Analytical models; Avalanche breakdown; Circuit simulation; Diodes; Equations; P-n junctions; SPICE; Temperature dependence; Tunneling; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.155882
Filename
155882
Link To Document