Title :
An uncertainty analysis for the measurement of intrinsic properties of materials by the combined transmission-reflection method
Author_Institution :
Dept. of Mater. Sci., Zhenjiang Univ., Hangzhou, China
fDate :
8/1/1992 12:00:00 AM
Abstract :
The uncertainty of measurements of the complex permittivity εr and permeability μr as a function of the normalized sample length l/Λ´ due to the measured errors in the scattering coefficients S11 and S 21 is discussed. A simple analysis of εr and μr and some measured data are given, which allows one to determine the extent of l/Λ´ and maximum uncertainty of the combined total transmission-reflection method in application to radar absorber measurements
Keywords :
S-parameters; electromagnetic wave absorption; electromagnetic wave scattering; magnetic permeability measurement; measurement errors; microwave measurement; permittivity measurement; radar; X-band; balancing bridge; complex permittivity; measured errors; measurement of intrinsic properties; microwave measurement; normalized sample length; permeability; radar absorber measurements; scattering coefficients; transmission-reflection method; uncertainty analysis; Dielectric materials; Frequency domain analysis; Length measurement; Light scattering; Measurement uncertainty; Numerical analysis; Permeability measurement; Permittivity measurement; Radar applications; Reflection;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
