Fourier-transform analysis of electrostatic potential distribution through a thick slit

Author

Kim, Youn S. ; Eom, Hyo J.

Author_Institution

Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea

Volume

38

Issue

1

fYear

1996

fDate

2/1/1996 12:00:00 AM

Firstpage

77

Lastpage

79

Abstract

A potential distribution through a slit in a thick conducting plane is examined. The Fourier-transform is used to represent the potential in the spectral domain and the boundary conditions are enforced to represent a solution in closed form. The solution is in a rapidly converging series so that it is numerically efficient. The Fourier-transform approach is novel in that it allows one to obtain a simple series solution without recourse to the Schwarz-Christoffel transformation

Keywords

Fourier analysis; Fourier transforms; convergence of numerical methods; electric fields; electric potential; spectral-domain analysis; Fourier-transform analysis; boundary conditions; closed form solution; electrostatic potential distribution; rapidly converging series; simple series solution; spectral domain; thick conducting plane; thick slit; Boundary conditions; Closed-form solution; Electrostatic analysis; Fourier transforms; Geometry; Laplace equations; Radiofrequency interference; Scattering;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.485699

Filename

485699