• DocumentCode
    761516
  • Title

    Electron avalanches. II. Fractal morphology of partial microdischarge spots on dielectric barriers

  • Author

    Ficker, T.

  • Author_Institution
    Departrnent of Phys., Tech. Univ. of Brno, Czech Republic
  • Volume
    10
  • Issue
    4
  • fYear
    2003
  • Firstpage
    700
  • Lastpage
    707
  • Abstract
    For pt.I see ibid., vol.10, no.4, p. 689-699 (2003). Microdischarge spots appearing on surfaces of dielectric barriers in sandwiched electrode systems have been studied. The study has been focused on streamer microdischarges which are a subject of continual interest not only in plasma physics (dielectric barrier discharges) but also in HV technology (partial discharges). The microdischarge spots have been visualized using photographic films that have played the role of dielectric barriers in experiments. The digitized pictures of microdischarge spots have been subjected to multifractal analysis. An inner structure of spots has been revealed and ascribed to streamer heads. The monofractal nature of the overall sets of microdischarge spots as well as the monofractality of the borders of the dark spot centers has been indicated. The inner structure of the dark centers has been classified as a non-fractal planar object. The study represents a first attempt to analyze microdischarge spots on dielectric barriers using general multifractal formalism.
  • Keywords
    electron avalanches; fractals; insulation; partial discharges; dielectric barriers; digitized pictures; electron avalanches; fractal geometry; general multifractal formalism; multifractal analysis; multifractal geometry; partial microdischarge spots; photographic films; sandwiched electrode systems; streamer heads; streamer microdischarge; Dielectrics; Electrodes; Electrons; Fractals; Partial discharges; Physics; Plasmas; Surface discharges; Surface morphology; Visualization;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2003.1219655
  • Filename
    1219655