Title :
Optimal design of life testing for ULSI circuit manufacturing
Author_Institution :
EG&G Idaho Inc., Idaho Falls, ID, USA
fDate :
2/1/1992 12:00:00 AM
Abstract :
The life testing of ultra large scale integration (ULSI) circuits is perhaps the most complex manufacturing process found today. This complexity is, in part, the result of product diversity, uncertainty, and changing technologies, and has caused the cost of testing for ULSI circuits to grow exponentially. The author develops a testing cost model and determines the optimum sample size on test which minimizes the expected total system cost assuming that the cost of waiting per unit time and the cost of placing an ULSI circuit on test are given. Numerical examples are also provided to illustrate the methods
Keywords :
VLSI; integrated circuit manufacture; integrated circuit testing; life testing; optimisation; ULSI circuit manufacturing; life testing; numerical examples; optimal design; optimum sample size; testing cost model; Circuit testing; Cost function; Integrated circuit manufacture; Integrated circuit technology; Life testing; Manufacturing processes; System testing; Ultra large scale integration; Uncertainty; Very large scale integration;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
