DocumentCode :
761651
Title :
Effect of system interactions on the removal of total oxidizable carbon from DI water polishing loops
Author :
Governal, Robert A. ; Bonner, Alison ; Shadman, Farhang
Author_Institution :
Dept. of Chem. Eng., Arizona Univ., Tucson, AZ, USA
Volume :
5
Issue :
1
fYear :
1992
fDate :
2/1/1992 12:00:00 AM
Firstpage :
70
Lastpage :
73
Abstract :
Ultra-pure water systems in semiconductor plants consist of many components. Although the operating principles behind each component are well-known, the interactions between system components, including cancellation and synergism, are not generally understood and taken into account. In this study, two examples of these interactions are studied and analyzed: UV interactions with membrane filters and UV interactions with ion exchange units. The results indicate that the sequencing of UV and filter affect the total oxidizable carbon removal efficiency and it is preferable to have filter before UV. UV followed by ion exchange is an effective configuration for some impurities but can be undesirable for some contaminants and particles
Keywords :
filtration; integrated circuit manufacture; ion exchange; radiation effects; semiconductor technology; water treatment; DI water polishing loops; UV interactions; cancellation; contaminants; impurities; ion exchange units; membrane filters; particles; semiconductor plants; synergism; system interactions; total oxidizable carbon removal efficiency; ultrapure water; Biomembranes; Carbon dioxide; Electronics industry; Filters; Oxidation; Polymers; Production; Purification; Resins; Semiconductor impurities;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.121983
Filename :
121983
Link To Document :
بازگشت