Double differential MPSK on the fast Rician fading channel

Author

Qu, Shouxing ; Fleisher, Solomon M.

Author_Institution

Dept. of Syst. & Comput. Eng., Carleton Univ., Ottawa, Ont., Canada

Volume

41

Issue

3

fYear

1992

fDate

8/1/1992 12:00:00 AM

Firstpage

278

Lastpage

295

Abstract

An analysis of adjacent and nonadjacent double differential M -ary PSK (M-ary D²PSK) on the fast Rician fading channel is presented. The probability density function (PDF) of the first-order phase error (FOPE) and the probability density functions of the second-order phase error (SOPE) for both adjacent and nonadjacent D²PSK on a fading channel have been derived. Asymptotic approximations for these PDFs are proposed in the case of channels with weak fading (including the additive white Gaussian noise (AWGN) channel) and high signal-to-noise ratio. For nonadjacent D²PSK with independent FOPEs a simplified PDF of SOPE has been obtained. The derived PDFs allow calculation of error performance of D²PSK, as well as of DPSK, on the Rician channel including the AWGN channel and the Rayleigh channel and verification of some results reported in the literature earlier. It is shown that nonadjacent D²PSK can be optimized by choosing a proper separation between the first-order phase differences

Keywords

digital radio systems; error statistics; fading; phase shift keying; telecommunication channels; AWGN channel; M-ary D²PSK; Rayleigh channel; additive white Gaussian noise; adjacent D²PSK; double differential M-ary PSK; error performance; error probability; fast Rician fading channel; first-order phase differences; first-order phase error; high signal-to-noise ratio; nonadjacent D²PSK; phase difference modulation; probability density function; second-order phase error; weak fading; AWGN; Additive white noise; Demodulation; Differential quadrature phase shift keying; Error probability; Fading; Frequency estimation; Phase shift keying; Probability density function; Rician channels;

fLanguage

English

Journal_Title

Vehicular Technology, IEEE Transactions on

Publisher

ieee

ISSN

0018-9545

Type

jour

DOI

10.1109/25.155975

Filename

155975