• DocumentCode
    761824
  • Title

    Transient-fault analysis for retry techniques

  • Author

    Saleh, Abdallah M. ; Patel, Janak H.

  • Author_Institution
    Bell Commun. Res., Red Bank, NJ, USA
  • Volume
    37
  • Issue
    3
  • fYear
    1988
  • fDate
    8/1/1988 12:00:00 AM
  • Firstpage
    323
  • Lastpage
    330
  • Abstract
    The problem of system recovery from transient faults is addressed using retry techniques. A probabilistic model for the activity of faulty periods, and a fault analysis to derive the optimum retry period are presented. Distribution functions are derived to represent the case of false alarm, where a transient fault is flagged as permanent, and the case of a miss because too many faults coexist, overcoming the checker´s capability to detect them. These derivations are compared with the results of a simulation program representing the model. Other factors influencing the value of the retry period are discussed
  • Keywords
    failure analysis; fault tolerant computing; system recovery; transients; false alarm; fault analysis; miss; probabilistic model; retry techniques; system recovery; transient faults; Aging; Circuit faults; Computational modeling; Electrical fault detection; Fault detection; Frequency; Reliability theory; System recovery; Transient analysis; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.3763
  • Filename
    3763