Title :
Transient-fault analysis for retry techniques
Author :
Saleh, Abdallah M. ; Patel, Janak H.
Author_Institution :
Bell Commun. Res., Red Bank, NJ, USA
fDate :
8/1/1988 12:00:00 AM
Abstract :
The problem of system recovery from transient faults is addressed using retry techniques. A probabilistic model for the activity of faulty periods, and a fault analysis to derive the optimum retry period are presented. Distribution functions are derived to represent the case of false alarm, where a transient fault is flagged as permanent, and the case of a miss because too many faults coexist, overcoming the checker´s capability to detect them. These derivations are compared with the results of a simulation program representing the model. Other factors influencing the value of the retry period are discussed
Keywords :
failure analysis; fault tolerant computing; system recovery; transients; false alarm; fault analysis; miss; probabilistic model; retry techniques; system recovery; transient faults; Aging; Circuit faults; Computational modeling; Electrical fault detection; Fault detection; Frequency; Reliability theory; System recovery; Transient analysis; Very large scale integration;
Journal_Title :
Reliability, IEEE Transactions on