Title :
Time of flight diffraction imaging for double-probe technique
Author :
Chang, Young-Fo ; Hsieh, Cheng-I
Author_Institution :
Inst. of Appl. Geophys., Nat. Chung Cheng Univ., Chiayi, Taiwan
fDate :
6/1/2002 12:00:00 AM
Abstract :
Due to rapid progress in microelectronics and computer technologies, the system evolving from analog to digital, and a programmable and flexible synthetic aperture focusing technique (SAFT) for the single-probe pulse-echo imaging technique of ultrasonic nondestructive testing (NDT) becomes feasible. The double-probe reflection technique usually is used to detect the nonhorizontal flaws in the ultrasonic NDT. Because there is an offset between the transmitter and receiver, the position and size of the flaw cannot be directly read from the image. Therefore, a digital signal processing (DSP) imaging method is proposed to process the ultrasonic image obtained by double-probe reflection technique. In the imaging, the signal is redistributed on an ellipsoid with the transmitter and receiver positions as focuses, and the traveltime sum for the echo from the ellipsoid to the focuses as the traveltime of signal. After redistributing all the signals, the useful signals can be constructively added in some point in which the reflected point is; otherwise, the signals will be destructively added. Therefore, the image resolution of the flaw can be improved and the position and size of the flaw can be estimated directly from the processed image. Based on the experimental results, the steep flaw (45/spl deg/) cannot be detected by the pulse echo technique but can be detected by the double-probe method, and the double-probe B-scan image of 30/spl deg/ tilted crack is clearer than the pulse echo B-scan image.
Keywords :
flaw detection; image resolution; ultrasonic imaging; ultrasonic materials testing; DSP imaging method; US image processing; US nondestructive testing; digital signal processing; double probe B-scan image; double-probe reflection technique; nonhorizontal flaws; synthetic aperture focusing technique; time of flight diffraction imaging; ultrasonic NDT imaging method; ultrasonic image; Analog computers; Diffraction; Digital signal processing; Ellipsoids; Focusing; Microelectronics; Nondestructive testing; Reflection; Transmitters; Ultrasonic imaging;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2002.1009335