Title :
East Meets West [Guest Editors´ Introduction:]
Author :
Zorian, Y. ; Hlavicka, J.
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Circuit testing; Collaboration; Digital systems; Electronic equipment testing; Europe; Formal verification; Hardware; High level synthesis; Sampling methods; Timing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1996.485777
