DocumentCode
762170
Title
East Meets West [Guest Editors´ Introduction:]
Author
Zorian, Y. ; Hlavicka, J.
Volume
13
Issue
1
fYear
1996
Firstpage
5
Abstract
Presents the guest editorial for this issue of the publication.
Keywords
Circuit testing; Collaboration; Digital systems; Electronic equipment testing; Europe; Formal verification; Hardware; High level synthesis; Sampling methods; Timing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1996.485777
Filename
485777
Link To Document