Title :
Frequency domain testing of ADCs
Author :
Mielke, Joseph A.
Author_Institution :
Credence Syst. Corp., Beaverton, OR, USA
Abstract :
Aimed at design and test engineers making the transition from strictly digital devices to devices with both digital and analog content, this tutorial introduces frequency domain analysis for the testing of mixed-signal devices. The author describes dynamic testing of analog-to-digital converters using Fourier analysis, including coherent sampling techniques. He also covers the challenges of implementing these techniques in a real system and analyzing results to identify problems
Keywords :
Fourier analysis; analogue-digital conversion; circuit testing; dynamic testing; frequency-domain analysis; ADC; Fourier analysis; analog-to-digital converters; coherent sampling; dynamic testing; frequency domain testing; mixed-signal device testing; Analog integrated circuits; Analog-digital conversion; Circuit testing; Clocks; Digital control; Feedback control; Frequency domain analysis; Hardware; Integrated circuit technology; Integrated circuit testing;
Journal_Title :
Design & Test of Computers, IEEE