Title :
Intel and the myths of test
Author :
Thompson, Kenneth M.
Author_Institution :
Technol., Manuf., & Eng. Group, Intel Corp., CA, USA
Abstract :
The author describes device testing at Intel, a company that tests 50 million microprocessors a year. He notes some myths that have grown up around testing and addresses the challenges facing test engineers, test system designers, and researchers
Keywords :
VLSI; computer testing; integrated circuit testing; microprocessor chips; Intel; VLSI; device testing; microprocessor testing; researchers; test engineers; test system designers; Bridge circuits; Circuit faults; Circuit testing; Costs; Design for testability; Ice; Logic testing; Microprocessors; Pins; Very large scale integration;
Journal_Title :
Design & Test of Computers, IEEE
