DocumentCode
762295
Title
Fringe Evaluation and Phase Unwrapping of Complicated Fringe Patterns by the Data-Dependent Fringe Processing Method
Author
Gurov, Igor ; Volkov, Mikhail
Author_Institution
Saint Petersburg State Univ. of Inf. Technol., Mech., & Opt.
Volume
55
Issue
5
fYear
2006
Firstpage
1634
Lastpage
1640
Abstract
Evaluation of noisy fringe patterns is important for solving problems of nondestructive testing and is widely used in moire, holographic, and speckle interferometry. In this paper, a new method of fringe pattern analysis has been proposed based on iterative estimation of local fringe amplitude, spacing, and orientation. Fringe parameter evaluation at each iteration step allows the formation of a two-dimensional (2-D) data-dependent anisotropic impulse response of a spatial filter that allows suppression of the noise influence without decreasing the fringe visibility. When the local fringe parameters are obtained, it is possible to find the phase difference at each point of the fringe pattern and at any other one within the local 2-D area. These local phase differences are utilized to recover the wrapped fringe phase at the point using a local model of the fringe pattern fitted under the criterion of root-mean-square error minimization. The high noise immunity of the proposed method was verified experimentally when processing complicated fringe patterns with 2-D fringe phase unwrapping
Keywords
mean square error methods; moire fringes; optical information processing; pattern recognition; spatial filters; transient response; 2D data-dependent anisotropic impulse response; 2D fringe phase unwrapping; data-dependent fringe processing method; fringe evaluation; fringe parameter evaluation; fringe pattern analysis; iterative estimation; local fringe amplitude; local fringe orientation; local fringe spacing; local phase differences; noise immunity; root-mean-square error minimization; spatial filter; Amplitude estimation; Anisotropic magnetoresistance; Holography; Interferometry; Iterative methods; Nondestructive testing; Pattern analysis; Spatial filters; Speckle; Two dimensional displays; Data-dependent fringe processing; fringe pattern; fringe phase unwrapping;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2006.880276
Filename
1703910
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