• DocumentCode
    762437
  • Title

    A linear feature extraction for multiclass classification problems based on class mean and covariance discriminant information

  • Author

    Hsieh, Pi-Fuei ; Wang, Deng-Shiang ; Hsu, Chia-Wei

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    28
  • Issue
    2
  • fYear
    2006
  • Firstpage
    223
  • Lastpage
    235
  • Abstract
    A parametric linear feature extraction method is proposed for multiclass classification. The skeleton of the proposed method consists of two types of schemes that are complementary to each other with regard to the discriminant information used. The approximate pairwise accuracy criterion (aPAC) and the common-mean feature extraction (CMFE) are chosen to exploit the discriminant information about class mean and about class covariance, respectively. Choosing aPAC rather than the linear discriminant analysis (LDA) can also resolve the problem of overemphasized large distances introduced by LDA, while maintaining other decent properties of LDA. To alleviate the suboptimum problem caused by a direct cascading of the two different types of schemes, there should be a mechanism for sorting and merging features based on their effectiveness. Usage of a sample-based classification error estimation for evaluation of effectiveness of features usually costs a lot of computational time. Therefore, we develop a fast spanning-tree-based parametric classification accuracy estimator as an intermediary for the aPAC and CMFE combination. The entire framework is parametric-based. This avoids paying a costly price in computation, which normally happens to the sample-based approach. Our experiments have shown that the proposed method can achieve a satisfactory performance on real data as well as simulated data.
  • Keywords
    approximation theory; covariance analysis; error analysis; feature extraction; pattern classification; approximate pairwise accuracy criterion; class mean discriminant information; classification error estimation; common-mean feature extraction; covariance discriminant information; linear feature extraction; multiclass classification problems; Computational modeling; Costs; Error analysis; Feature extraction; Instruments; Linear discriminant analysis; Merging; Redundancy; Skeleton; Sorting; Bhattacharyya distance.; Index Terms- Dimensionality reduction; classification error estimation; discriminant analysis; linear discriminant analysis; linear feature extraction; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Discriminant Analysis; Information Storage and Retrieval; Linear Models; Pattern Recognition, Automated; Statistics as Topic;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2006.26
  • Filename
    1561182