Title :
Global segmentation and curvature analysis of volumetric data sets using trivariate B-spline functions
Author :
Soldea, O. ; Elber, G. ; Rivlin, E.
Author_Institution :
Dept. of Comput. Sci., Technion-Israel Inst. of Technol., Haifa, Israel
Abstract :
This paper presents a method to globally segment volumetric images into regions that contain convex or concave (elliptic) iso-surfaces, planar or cylindrical (parabolic) iso-surfaces, and volumetric regions with saddle-like (hyperbolic) iso-surfaces, regardless of the value of the iso-surface level. The proposed scheme relies on a novel approach to globally compute, bound, and analyze the Gaussian and mean curvatures of an entire volumetric data set, using a trivariate B-spline volumetric representation. This scheme derives a new differential scalar field for a given volumetric scalar field, which could easily be adapted to other differential properties. Moreover, this scheme can set the basis for more precise and accurate segmentation of data sets targeting the identification of primitive parts. Since the proposed scheme employs piecewise continuous functions, it is precise and insensitive to aliasing.
Keywords :
Gaussian processes; feature extraction; image segmentation; splines (mathematics); Gaussian curvature; concave iso-surfaces; convex iso-surface; curvature analysis; cylindrical iso-surfaces; differential scalar field; global segmentation; saddle-like iso-surfaces; trivariate B-spline functions; volumetric data sets; volumetric images; Data analysis; Image analysis; Image databases; Image recognition; Image reconstruction; Image segmentation; Object recognition; Spline; Surface reconstruction; Index Terms- Gaussian and mean curvature; global analysis; segmentation.; symbolic computation; Algorithms; Artificial Intelligence; Databases, Factual; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2006.36