Title :
Internal Stress of Co-Cr Perpendicular Media
Author :
Tagami, Katsumichi
Author_Institution :
Microelectronics Res. Labs., NEC Corporation.
fDate :
4/1/1985 12:00:00 AM
Keywords :
Anisotropic magnetoresistance; Chromium; Compressive stress; Crystallization; Grain size; Internal stresses; Magnetic films; Mechanical factors; Sputtering; Stress control;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1985.4548432
