DocumentCode :
762974
Title :
Compact modeling of the influence of emitter stored charge on the high frequency small signal AC response of bipolar transistors using quasi-static parameters
Author :
Hamel, J.S.
Author_Institution :
Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch
Volume :
31
Issue :
1
fYear :
1996
fDate :
1/1/1996 12:00:00 AM
Firstpage :
106
Lastpage :
113
Abstract :
A model involving only quasi-static parameters is proposed which is capable of modeling the influence of high frequency nonquasi-static stored charge distributions in the neutral emitter region on the small signal high frequency ac response of bipolar transistors. Quasi-static ac model parameters are completely determined from static charge distributions for arbitrary impurity profiles, thereby enabling high frequency behavior to be accurately deduced for realistic device structures without the need for high frequency numerical simulation or measurement. The proposed model provides quantitative information regarding the transition from quasi-static to nonquasi-static behavior of emitter stored charges. An existing equivalent circuit representation that accurately models the influence of the stored base charge, and which is suitable for SPICE simulations, is modified to include the impact of quasi-static charge distributions in the emitter region
Keywords :
SPICE; bipolar transistors; equivalent circuits; semiconductor device models; SPICE simulation; bipolar transistors; emitter stored charge; equivalent circuit; high frequency small signal AC response; impurity profiles; model; quasi-static parameters; Admittance; Bipolar transistors; Charge measurement; Current measurement; Delay effects; Equivalent circuits; Frequency estimation; Impurities; Numerical simulation; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.485872
Filename :
485872
Link To Document :
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