Title :
Low Thermal Budget Processing for Sequential 3-D IC Fabrication
Author :
Rajendran, Bipin ; Shenoy, Rohit S. ; Witte, Daniel J. ; Chokshi, Nehal S. ; DeLeon, Robert L. ; Tompa, G.S. ; Fabian, R.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA
fDate :
4/1/2007 12:00:00 AM
Abstract :
Laser annealing can be used for electrical activation of dopants without excessively heating the material deeper within the work piece. The authors demonstrate that laser annealing could be used for activating the dopants in the upper levels of an exemplary 3-D integrated circuit structure without affecting the operation of the devices below. We then use a 450 degC low-temperature oxide deposition process for forming the gate oxide and laser annealing for activating the dopants at the source/drain and gate regions to fabricate CMOS transistors. This process can be used to fabricate the transistors on the upper levels of a general 3-D IC structure without affecting the quality of the devices below
Keywords :
CMOS integrated circuits; MOSFET; chemical vapour deposition; integrated circuit manufacture; laser beam annealing; 450 C; CMOS transistors; CMOSFET; LPCVD; electrical activation; gate oxide; gate regions; integrated circuit fabrication; laser annealing; low thermal budget processing; low-pressure chemical vapor deposition; source/drain; Annealing; CMOS process; Chemical lasers; Chemical vapor deposition; Heating; Integrated circuit interconnections; MOSFETs; Optical device fabrication; Optical materials; Three-dimensional integrated circuits; CMOSFET; integrated circuit fabrication; laser annealing; low-pressure chemical vapor deposition (LPCVD);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.891300