DocumentCode :
763349
Title :
Chemistry is right for T-ray imaging
Author :
Nuss, Martin C.
Author_Institution :
AT&T Bell Labs., Holmdel, NJ, USA
Volume :
12
Issue :
2
fYear :
1996
fDate :
3/1/1996 12:00:00 AM
Firstpage :
25
Lastpage :
30
Abstract :
What do you get if you combine very high frequency microwaves, real-time imaging, submillimeter spatial resolution, and chemical sensitivity? The answer is Terahertz, or “T”-ray, imaging. This novel imaging technology operates in the submillimeterwave region of the electro-magnetic spectrum, a portion of the spectrum that was previously hard to access using conventional technologies. But recent advances in high-speed optoelectronic and femtosecond laser technology facilitate generation and detection of short bursts of terahertz radiation, which have proven to be extremely useful for spectroscopic measurements in the submillimeter-wave range. T-ray imaging combines these spectroscopic measurements with real-time imaging and advanced signal processing and recognition, so that each pixel element of the image contains spectroscopic information about the object. In many cases, the spectroscopic information gives us significant clues about the chemical composition of the object of interest
Keywords :
measurement by laser beam; spectrochemical analysis; submillimetre wave imaging; submillimetre wave lasers; submillimetre wave spectroscopy; T-ray imaging; chemical composition; chemical sensitivity; femtosecond laser technology; pixel element; real-time imaging; spectroscopic measurements; submillimeter spatial resolution; submillimeterwave region; terahertz imaging; Chemical technology; Chemistry; Frequency; High-resolution imaging; Microwave imaging; Optical imaging; Spatial resolution; Spectroscopy; Submillimeter wave measurements; Submillimeter wave technology;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/101.485909
Filename :
485909
Link To Document :
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