Title :
A/D converter characterization by spectral analysis in “Dual-Tone” mode
Author :
Benkaïs, Mohammed ; Le Masson, Sylvie ; Marchegay, Philippe
Author_Institution :
IXL, Bordeaux I Univ., Talence, France
fDate :
10/1/1995 12:00:00 AM
Abstract :
Analog-to-digital (A/D) converter performances are constantly improving, concerning both conversion speed and resolution. Consequently, characterization becomes harder as the limits of the testing instrumentation are reached. We tried to answer that problem by defining a test methodology based on “dual-tone” spectral analysis. In this paper we present both the basic principles of this method and also experimental results on A/D converters
Keywords :
analogue-digital conversion; circuit noise; circuit testing; electric noise measurement; spectral analysis; 18 MHz; A/D converter characterization; conversion speed; distortion performance; dual-tone mode spectral analysis; noise measurement; resolution; test methodology; Discrete Fourier transforms; Frequency conversion; Harmonic distortion; Intermodulation distortion; Linearity; Polynomials; Power harmonic filters; Spectral analysis; Testing; Transfer functions;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
