DocumentCode :
763849
Title :
CACOP-a random pattern testability analyzer
Author :
Jone, Wen-Ben ; Das, Sunil R.
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Chung-Cheng Univ., Taiwan
Volume :
25
Issue :
5
fYear :
1995
fDate :
5/1/1995 12:00:00 AM
Firstpage :
865
Lastpage :
871
Abstract :
In this paper a new method called CACOP For the detection probability analyses of random test patterns is proposed. Considering computational complexity, CACOP is a compromise between O(n2) testability analyses like full-range cutting algorithm (FRCA) and linear time testability analyses like the controllability observability program (COP). By propagating bounds of controllabilities and observabilities, CACOP can determine the detection probability lower bound (DPLB) efficiently. The DPLBs derived by CACOP are potentially higher (and thus more accurate) than by FRCA; in addition, CACOP is computationally more efficient than FRCA. The conventional linear time testability analyses cannot guarantee the derivation of DPLBs. On the contrary, CACOP can achieve the goal with tolerable increase in computing complexity
Keywords :
automatic testing; built-in self test; computational complexity; controllability; integrated circuit testing; logic testing; observability; probability; CACOP; O(n2) testability analyses; computational complexity; controllability observability program; detection probability; full-range cutting algorithm; linear time testability analyses; lower bound; random pattern testability analyzer; Algorithm design and analysis; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computational modeling; Controllability; Frequency; Pattern analysis; Test pattern generators;
fLanguage :
English
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9472
Type :
jour
DOI :
10.1109/21.376499
Filename :
376499
Link To Document :
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