• DocumentCode
    764050
  • Title

    Dependent and multimode failures in reliability evaluation of extra-stage shuffle-exchange MINs

  • Author

    Trahan, Jerry L. ; Wang, Daniel X. ; Rai, Suresh

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
  • Volume
    44
  • Issue
    1
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    73
  • Lastpage
    86
  • Abstract
    Previous reliability evaluations for multistage interconnection networks (MINs) assumed that “all failures are statistically-independent and that no degraded operational modes exist for switches”, though these assumptions are not realistic. For example, researchers have described instances of statistically-dependent failures, or fault side-effects, in some MINs. This paper presents efficient algorithms for terminal, broadcast, and K-terminal reliability evaluation of the shuffle-exchange network with an extra stage (SENE), a redundant-path MIN, under assumptions that allow statistical-dependence between failures and degraded operational modes for switches. A modified shock-model incorporates failure statistical-dependency and multiple operational modes into the reliability evaluation. For an N×N SENE, the reliability algorithms and their run-times are: terminal and broadcast →O(log(N)), and K-terminal→O(|K|·log(N))
  • Keywords
    computer network reliability; failure analysis; hypercube networks; multistage interconnection networks; K-terminal reliability; algorithms; broadcast reliability; extra stage; failure statistical dependency; fault side-effect; modified shock model; multiple operational modes; multistage interconnection networks; reliability evaluation; run times; shuffle exchange network; statistically-dependent failures; terminal reliability; Broadcasting; Computer applications; Computer network reliability; Concurrent computing; Degradation; Integrated circuit modeling; Intelligent networks; Multiprocessor interconnection networks; Parallel processing; Probability;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.376524
  • Filename
    376524