DocumentCode :
764060
Title :
A combinatorial approach to modeling imperfect coverage
Author :
Doyle, Stacy A. ; Dugan, Joanne Bechta ; Patterson-Hine, F. Ann
Author_Institution :
Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
Volume :
44
Issue :
1
fYear :
1995
fDate :
3/1/1995 12:00:00 AM
Firstpage :
87
Lastpage :
94
Abstract :
A new algorithm combines a coverage model with a combinatorial model to compute system unreliability. Its advantage is that for a class of computer systems, it is simpler than current algorithms. The method applies to combinatorial models which can generate cutsets for the system. This set of cutsets is augmented with cutsets representing the uncovered failures of the system. The resulting set is manipulated by combining standard multi-state and sum-of-disjoint products solution techniques. It is possible to compute the exact unreliability of the system using this algorithm. If the size of the system and the time required for the analysis become prohibitive, however, the solution can be truncated and bounds on the system unreliability computed. The authors´ algorithm is important because it adapts standard combinatorial solution techniques to a problem that was previously thought to require a Markov solution. The ability to model a fault-tolerant computer system completely within a combinatorial model allows results to be calculated more quickly and accurately, and thus to impact system design. This new technology is easily integrated into existing design/analysis methodologies. Coverage provides a more accurate picture of system behavior, and gives more faith in reliability estimates
Keywords :
combinatorial mathematics; fault tolerant computing; reliability; algorithm; combinatorial approach; fault-tolerant computer system; imperfect coverage; modeling; multi-state solution technique; sum-of-disjoint products solution technique; system unreliability; Algorithm design and analysis; Computer errors; Design methodology; Error analysis; Fault detection; Fault tolerant systems; Fault trees; NASA; Redundancy; System analysis and design;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.376525
Filename :
376525
Link To Document :
بازگشت