• DocumentCode
    764283
  • Title

    Frequency limitation in the calibration of microwave test fixtures

  • Author

    Zhu, Ning Hua ; Qian, Chen ; Wang, You Lin ; Pun, Edwin Y B ; Chung, Po-Shuen

  • Author_Institution
    State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China
  • Volume
    51
  • Issue
    9
  • fYear
    2003
  • Firstpage
    2000
  • Lastpage
    2006
  • Abstract
    The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru-short-match (TSM) method is outlined. It is found that the conventional TSM method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. This limitation can be avoided by using a different algorithm. The various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. Several ways in avoiding the problem are proposed. There is good agreement between the theories and experimental data.
  • Keywords
    S-parameters; calibration; measurement standards; microwave measurement; network analysers; asymmetric fixtures; calibration; deembedding; microwave network analyzer; microwave test fixtures; scattering parameter; standards; symmetric fixtures; thru-short-match method; Calibration; Equations; Fixtures; Frequency; Microwave devices; Microwave measurements; Reflection; Scattering parameters; Testing; Transmission lines;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2003.815871
  • Filename
    1220788