DocumentCode
764283
Title
Frequency limitation in the calibration of microwave test fixtures
Author
Zhu, Ning Hua ; Qian, Chen ; Wang, You Lin ; Pun, Edwin Y B ; Chung, Po-Shuen
Author_Institution
State Key Lab. on Integrated Optoelectronics, Chinese Acad. of Sci., Beijing, China
Volume
51
Issue
9
fYear
2003
Firstpage
2000
Lastpage
2006
Abstract
The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru-short-match (TSM) method is outlined. It is found that the conventional TSM method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. This limitation can be avoided by using a different algorithm. The various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. Several ways in avoiding the problem are proposed. There is good agreement between the theories and experimental data.
Keywords
S-parameters; calibration; measurement standards; microwave measurement; network analysers; asymmetric fixtures; calibration; deembedding; microwave network analyzer; microwave test fixtures; scattering parameter; standards; symmetric fixtures; thru-short-match method; Calibration; Equations; Fixtures; Frequency; Microwave devices; Microwave measurements; Reflection; Scattering parameters; Testing; Transmission lines;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2003.815871
Filename
1220788
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