DocumentCode
764503
Title
Shear wave imaging for deep nondestructive evaluation
Author
Zhang, Dejing ; Crean, G.M.
Author_Institution
Nat. Microelectron. Res. Centre, Cork, Ireland
Volume
27
Issue
24
fYear
1991
Firstpage
2248
Lastpage
2250
Abstract
Deep subsurface high resolution shear wave imaging using a conventional acoustic microscope and lens is presented. The technique is based on mode conversion phenomena which occur when a focused acoustic beam is incident from water at a material surface. A theoretical framework for the interpretation of the experimental results is discussed. Experimental results are presented using a 50 MHz acoustic lens with a 28 degrees aperture and 11.5 mm working distance in water.
Keywords
acoustic microscopy; inspection; nondestructive testing; ultrasonic materials testing; 50 MHz; acoustic lens; acoustic microscope; deep nondestructive evaluation; focused acoustic beam; high resolution; mode conversion; subsurface;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19911391
Filename
109515
Link To Document