• DocumentCode
    764503
  • Title

    Shear wave imaging for deep nondestructive evaluation

  • Author

    Zhang, Dejing ; Crean, G.M.

  • Author_Institution
    Nat. Microelectron. Res. Centre, Cork, Ireland
  • Volume
    27
  • Issue
    24
  • fYear
    1991
  • Firstpage
    2248
  • Lastpage
    2250
  • Abstract
    Deep subsurface high resolution shear wave imaging using a conventional acoustic microscope and lens is presented. The technique is based on mode conversion phenomena which occur when a focused acoustic beam is incident from water at a material surface. A theoretical framework for the interpretation of the experimental results is discussed. Experimental results are presented using a 50 MHz acoustic lens with a 28 degrees aperture and 11.5 mm working distance in water.
  • Keywords
    acoustic microscopy; inspection; nondestructive testing; ultrasonic materials testing; 50 MHz; acoustic lens; acoustic microscope; deep nondestructive evaluation; focused acoustic beam; high resolution; mode conversion; subsurface;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911391
  • Filename
    109515