DocumentCode
764686
Title
Sensitive 320 Gbit/s eye diagram measurements via optical sampling with semiconductor optical amplifier-ultrafast nonlinear interferometer
Author
Kang, Inuk ; Dreyer, K.F.
Author_Institution
Lucent Technol. Bell Labs., Holmdel, NJ, USA
Volume
39
Issue
14
fYear
2003
fDate
7/10/2003 12:00:00 AM
Firstpage
1081
Lastpage
1083
Abstract
High bit rate (320 Gbit/s) all-optical eye measurements requiring only milliwatt signal power and 25 fJ sampling pulse energy are reported. The system is based on a semiconductor optical amplifier interferometer with time-domain filtering of the ASE noise.
Keywords
light interferometers; optical communication; semiconductor optical amplifiers; superradiance; time-domain analysis; 25 fJ; 320 Gbit/s; ASE noise; eye diagram measurements; milliwatt signal power; optical sampling; sampling pulse energy; semiconductor optical amplifier-ultrafast nonlinear interferometer; time-domain filtering;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20030681
Filename
1220829
Link To Document