• DocumentCode
    764742
  • Title

    Micro-Structure and Magnetic Properties of Perpendicular Magnetized Co-CoO Sputtered Films

  • Author

    Tamari, K. ; Ohkoshi, M.X. ; Honda, S. ; Kusuda, T.

  • Author_Institution
    Faculty of Eng., Hiroshima Univ.
  • Volume
    1
  • Issue
    4
  • fYear
    1985
  • fDate
    7/1/1985 12:00:00 AM
  • Firstpage
    413
  • Lastpage
    419
  • Abstract
    The electrical resistivity of reactive RF sputtered Co-CoO films increases and the temperature coefficient of resistivity decreases with the formation of CoO. For films with a saturation magnetization (Ms) of more than 670 emu/cm3, the resistivity decreases irreversibly above 370 K by deoxidization. For films with an Ms of less than 470 emu/cm3, the resistivity increases irreversibly above 420 K. After the irreversible increase in resistivity, the coercivity (Hc) and squareness ratio of the hysteresis loop perpendicular to the film plane increase, and the Hc parallel to the film plane decreases.
  • Keywords
    Anisotropic conductive films; Argon; Coercive force; Conductivity; Magnetic films; Magnetic properties; Magnetooptic recording; Perpendicular magnetic anisotropy; Substrates; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1985.4548815
  • Filename
    4548815