DocumentCode :
764742
Title :
Micro-Structure and Magnetic Properties of Perpendicular Magnetized Co-CoO Sputtered Films
Author :
Tamari, K. ; Ohkoshi, M.X. ; Honda, S. ; Kusuda, T.
Author_Institution :
Faculty of Eng., Hiroshima Univ.
Volume :
1
Issue :
4
fYear :
1985
fDate :
7/1/1985 12:00:00 AM
Firstpage :
413
Lastpage :
419
Abstract :
The electrical resistivity of reactive RF sputtered Co-CoO films increases and the temperature coefficient of resistivity decreases with the formation of CoO. For films with a saturation magnetization (Ms) of more than 670 emu/cm3, the resistivity decreases irreversibly above 370 K by deoxidization. For films with an Ms of less than 470 emu/cm3, the resistivity increases irreversibly above 420 K. After the irreversible increase in resistivity, the coercivity (Hc) and squareness ratio of the hysteresis loop perpendicular to the film plane increase, and the Hc parallel to the film plane decreases.
Keywords :
Anisotropic conductive films; Argon; Coercive force; Conductivity; Magnetic films; Magnetic properties; Magnetooptic recording; Perpendicular magnetic anisotropy; Substrates; X-ray diffraction;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1985.4548815
Filename :
4548815
Link To Document :
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