DocumentCode
764742
Title
Micro-Structure and Magnetic Properties of Perpendicular Magnetized Co-CoO Sputtered Films
Author
Tamari, K. ; Ohkoshi, M.X. ; Honda, S. ; Kusuda, T.
Author_Institution
Faculty of Eng., Hiroshima Univ.
Volume
1
Issue
4
fYear
1985
fDate
7/1/1985 12:00:00 AM
Firstpage
413
Lastpage
419
Abstract
The electrical resistivity of reactive RF sputtered Co-CoO films increases and the temperature coefficient of resistivity decreases with the formation of CoO. For films with a saturation magnetization (Ms ) of more than 670 emu/cm3, the resistivity decreases irreversibly above 370 K by deoxidization. For films with an Ms of less than 470 emu/cm3, the resistivity increases irreversibly above 420 K. After the irreversible increase in resistivity, the coercivity (Hc ) and squareness ratio of the hysteresis loop perpendicular to the film plane increase, and the Hc parallel to the film plane decreases.
Keywords
Anisotropic conductive films; Argon; Coercive force; Conductivity; Magnetic films; Magnetic properties; Magnetooptic recording; Perpendicular magnetic anisotropy; Substrates; X-ray diffraction;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1985.4548815
Filename
4548815
Link To Document