• DocumentCode
    76485
  • Title

    Simulation of Lightning Electromagnetic Fields and Application to Immunity Testing

  • Author

    Yazhou Chen ; Haojiang Wan ; Xing Zhou

  • Author_Institution
    Shijiazhuang Mech. Eng. Coll., Shijiazhuang, China
  • Volume
    57
  • Issue
    4
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    709
  • Lastpage
    718
  • Abstract
    A kind of low-cost electric and magnetic field simulators, which are used to produce simulative lightning electromagnetic pulse (LEMP) with adjustable waveforms and intensity output, are presented. The lightning electric field can be produced within the GTEM cell by feed-in of impulse voltage output by a Marx generator. The lightning magnetic field can be produced within the coil by feed-in of surge current from the lightning surge generator. The simulated magnetic field is measured by a “B-dot” coil. The measured results show that the lightning electric field simulator and magnetic field simulator could provide relatively homogeneous LEMP environment within certain area in the GTEM cell and the coil within 3 dB deviation. The effects of the simulated lightning electric fields on some electronic devices and the influence of the turns and size of the coil on the homogeneity of the simulated magnetic fields are also investigated.
  • Keywords
    coils; electromagnetic fields; immunity testing; lightning protection; pulse generators; surge protection; B-dot coil; GTEM cell; LEMP simulation; Marx generator; electromagnetic field lightning simulation; electronic device; immunity testing; impulse voltage feed-in; lightning electric field simulator; lightning electromagnetic pulse simulation; lightning magnetic field; lightning magnetic field simulator; lightning surge generator; low-cost electric field simulator; low-cost magnetic field simulator; surge current feed-in; Generators; Lightning; Oscillators; Surges; TEM cells; Electromagnetic field; electromagnetic radiation effect; lightning; simulation;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2015.2430936
  • Filename
    7112107