Title :
Effect of Localized Stress on Power Loss in (110) [001] Si-Fe with Law Thickness
Author :
Takeda, K. ; Ueda, F. ; Yamaguchi, T.
Author_Institution :
Fukuoka Institute of Technology.
fDate :
7/1/1985 12:00:00 AM
Abstract :
Investigations of the conditions for low losses in ultra-thin grain-oriented silicon steel sheets are described. The eddy current loss was found to be very large when the angle of inclination of the [001] axis against the sheet surface was 3° or less. The effect of scribe processes on 0.1 mm sheets was studied, by performing scribing on 3 percent Si-Fe single-layer sheets while varying the scribe load and spacing. Saturation of loss reduction was thought to occur for a load of 90 g at a spacing of 2.5 mm or less. Scribing had an effect when large spacings and large loads, or when small spacings and small loads, were used.
Keywords :
Annealing; Building materials; Eddy currents; Magnetic domains; Magnetics Society; Sheet materials; Silicon; Steel; Stress; Transformer cores;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1985.4548827