Title :
Current-Induced Magnetization Switching and CPP-GMR in 30 nm

Scale Spin Valves Fabricated Using EB-Assisted CVD Hard Masks
Author :
Isogami, Shinji ; Tsunoda, Masakiyo ; Takahashi, Migaku
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai
Abstract :
In this study, current-perpendicular-to-plane great magnetoresistance (CPP-GMR) spin valves with the minimum pillar width of 34 nm phi were successfully fabricated using EB-assisted chemical-vapor-deposition (CVD) hard masks. An area of the obtained magnetic cell is about one order smaller compared with those fabricated with normal EB or photo lithography technique. Measurement of transport properties such as current-induced magnetization switching (CIMS) and MR were demonstrated in such spin valves with various pillar widths. Dependence of the CPP-MR properties on the milled pillar width was discussed. In the case of 66 nm phi width in particular, the MR by external magnetic field switching and CIMS were 0.4% and 0.3%, respectively. The critical switching current Ic was ~40 mA (J c~9times108 A/cm2). In the case of smaller width, only MR by external magnetic field was observed
Keywords :
chemical vapour deposition; current density; giant magnetoresistance; magnetic multilayers; magnetisation; spin valves; CVD hard masks; chemical-vapor-deposition; critical current density; current-induced magnetization switching; current-perpendicular-to-plane great magnetoresistance; electron beam; scanning electron microscope; spin valves; transport property; Chemical vapor deposition; Computer integrated manufacturing; Current measurement; Lithography; Magnetic field measurement; Magnetic properties; Magnetic switching; Magnetization; Magnetoresistance; Spin valves; CPP-GMR spin valve; Chemical–vapor–deposition (CVD); critical current density; current-induced magnetization switching (CIMS); electron beam (EB); magnetoresistance (MR); scanning electron microscope (SEM);
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.878858