• DocumentCode
    764958
  • Title

    Current-Induced Magnetization Switching and CPP-GMR in 30 nm \\phi Scale Spin Valves Fabricated Using EB-Assisted CVD Hard Masks

  • Author

    Isogami, Shinji ; Tsunoda, Masakiyo ; Takahashi, Migaku

  • Author_Institution
    Dept. of Electron. Eng., Tohoku Univ., Sendai
  • Volume
    42
  • Issue
    10
  • fYear
    2006
  • Firstpage
    2676
  • Lastpage
    2678
  • Abstract
    In this study, current-perpendicular-to-plane great magnetoresistance (CPP-GMR) spin valves with the minimum pillar width of 34 nm phi were successfully fabricated using EB-assisted chemical-vapor-deposition (CVD) hard masks. An area of the obtained magnetic cell is about one order smaller compared with those fabricated with normal EB or photo lithography technique. Measurement of transport properties such as current-induced magnetization switching (CIMS) and MR were demonstrated in such spin valves with various pillar widths. Dependence of the CPP-MR properties on the milled pillar width was discussed. In the case of 66 nm phi width in particular, the MR by external magnetic field switching and CIMS were 0.4% and 0.3%, respectively. The critical switching current Ic was ~40 mA (J c~9times108 A/cm2). In the case of smaller width, only MR by external magnetic field was observed
  • Keywords
    chemical vapour deposition; current density; giant magnetoresistance; magnetic multilayers; magnetisation; spin valves; CVD hard masks; chemical-vapor-deposition; critical current density; current-induced magnetization switching; current-perpendicular-to-plane great magnetoresistance; electron beam; scanning electron microscope; spin valves; transport property; Chemical vapor deposition; Computer integrated manufacturing; Current measurement; Lithography; Magnetic field measurement; Magnetic properties; Magnetic switching; Magnetization; Magnetoresistance; Spin valves; CPP-GMR spin valve; Chemical–vapor–deposition (CVD); critical current density; current-induced magnetization switching (CIMS); electron beam (EB); magnetoresistance (MR); scanning electron microscope (SEM);
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.878858
  • Filename
    1704402