Title :
SAR image denoising via Bayesian wavelet shrinkage based on heavy-tailed modeling
Author :
Achim, Alin ; Tsakalides, Panagiotis ; Bezerianos, Anastasios
Author_Institution :
Med. Phys. Dept., Patras Univ., Greece
Abstract :
Synthetic aperture radar (SAR) images are inherently affected by multiplicative speckle noise, which is due to the coherent nature of the scattering phenomenon. This paper proposes a novel Bayesian-based algorithm within the framework of wavelet analysis, which reduces speckle in SAR images while preserving the structural features and textural information of the scene. First, we show that the subband decompositions of logarithmically transformed SAR images are accurately modeled by alpha-stable distributions, a family of heavy-tailed densities. Consequently, we exploit this a priori information by designing a maximum a posteriori (MAP) estimator. We use the alpha-stable model to develop a blind speckle-suppression processor that performs a nonlinear operation on the data and we relate this nonlinearity to the degree of non-Gaussianity of the data. Finally, we compare our proposed method to current state-of-the-art soft thresholding techniques applied on real SAR imagery and we quantify the achieved performance improvement.
Keywords :
Bayes methods; geophysical signal processing; geophysical techniques; radar imaging; remote sensing by radar; speckle; synthetic aperture radar; terrain mapping; wavelet transforms; Bayes method; MAP estimator; SAR imagery; SAR imaging; algorithm; denoising; estimator; geophysical measurement technique; heavy tailed modeling; land surface; maximum a posteriori; multiplicative speckle noise; radar remote sensing; signal processing; subband decompositions; synthetic aperture radar; terrain mapping; wavelet analysis; wavelet shrinkage; Algorithm design and analysis; Bayesian methods; Image analysis; Image denoising; Image texture analysis; Information analysis; Radar scattering; Speckle; Synthetic aperture radar; Wavelet analysis;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
DOI :
10.1109/TGRS.2003.813488