Title :
High Frequency Permeability Measurement of Magnetic Thin Films
Author :
Hayakawa, M. ; Hayashi, K. ; Ochiai, Y. ; Matsuda, H. ; Ishikawa, W. ; Uedaira, S. ; Aso, K.
Author_Institution :
Sony Corp. Research Center.
fDate :
7/1/1985 12:00:00 AM
Abstract :
A device for automated measurement of the permeability of thin films is described. Specimens are placed in a high frequency band magnetic field, and the induced emf measured using a differential detection coil, with a damping resistance inserted to prevent resonance. The frequency is varied to find the ¿-f characteristic. The device was used to measure the characteristic of a sputtered Sendust film 4 mm by 4 ¿m up to 100 MHz; measurements required only a few minutes´ time.
Keywords :
Coils; Damping; Electrical resistance measurement; Frequency measurement; Magnetic field measurement; Magnetic films; Magnetic resonance; Permeability measurement; Thin film devices; Time measurement;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1985.4548846
