Title :
Error estimation in multicanonical Monte Carlo Simulations with applications to polarization-mode-dispersion emulators
Author :
Lima, Aurenice O. ; Lima, Ivan T., Jr. ; Menyuk, Curtis R.
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD, USA
Abstract :
This paper shows how to estimate errors in multicanonical Monte Carlo (MMC) simulations using a transition-matrix method. MMC is a biasing Monte Carlo technique that allows one to compute the probability of rare events, such as the outage probability in optical-fiber communication systems. Since MMC is a Monte Carlo technique, it is subject to statistical errors, and it is essential to determine their magnitude. Since MMC is a highly nonlinear iterative method, linearized error-propagation techniques and standard error analyses do not work, and a more sophisticated method is needed. The proposed method is based on bootstrap techniques. This method was applied to efficiently estimate the error in the probability density function (pdf) of the differential group delay (DGD) of polarization-mode-dispersion (PMD) emulators that has been calculated using MMC. The method was validated by comparison to the results obtained using a large ensemble of MMC simulations.
Keywords :
Monte Carlo methods; error analysis; iterative methods; optical fibre communication; optical fibre dispersion; optical fibre polarisation; probability; telecommunication computing; bootstrap techniques; differential group delay; error estimation; multicanonical Monte Carlo simulations; nonlinear iterative method; optical-fiber communication; polarization-mode-dispersion emulators; probability density function; statistical errors; transition-matrix method; Computational modeling; Computer science; Delay estimation; Error analysis; Iterative methods; Monte Carlo methods; Nonlinear optics; Optical fiber communication; Polarization; Probability distribution; Multicanonical Monte Carlo (MMC) simulations; optical communications; polarization-mode dispersion (PMD); statistical error;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2005.857728