DocumentCode :
76528
Title :
A Low-Power Pilot-DAC Based Column Parallel 8b SAR ADC With Forward Error Correction for CMOS Image Sensors
Author :
Chen, Denis Guangyin ; Fang Tang ; Bermak, Amine
Author_Institution :
Electron. & Comput. Eng. Dept., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
Volume :
60
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
2572
Lastpage :
2583
Abstract :
Successive-Approximation-Register (SAR) Analog- to-Digital Converters (ADC) have been shown to be suitable for low-power applications at aggressively scaled CMOS technology nodes. This is desirable for many mobile and portable applications. Unfortunately, SAR ADCs tend to incur significant area cost and reference loading due to the large capacitor array used in its Digital-to-Analog Converter (DAC). This has traditionally made it difficult to implement large numbers of SAR ADC in parallel. This paper describes a compact 8b SAR ADC measuring only 348 μm×7 μm. It uses a new pilot-DAC (pDAC) technique to reduce the power consumption in its capacitor array; moreover, the accuracy of the pDAC scheme is protected by a novel mixed-signal Forward Error Correction (FEC) algorithm with minimal circuit overhead. Any DAC error made during pDAC operation can be recovered later by an additional switching phase. Prototype measurements in 0.18 μm technology shows that the DAC´s figure-of-merit (FoM) is reduced from 61.3 fJ/step to 39.8 fJ/step by adopting pDAC switching with no apparent deterioration in Fixed-Pattern Noise (FPN) and thermal noise.
Keywords :
CMOS image sensors; digital-analogue conversion; forward error correction; low-power electronics; thermal noise; CMOS image sensor; FEC algorithm; FPN; FoM; analog-to-digital converter; capacitor array; column parallel SAR ADC; digital-to-analog converter; figure-of-merit; fixed-pattern noise; mixed-signal forward error correction algorithm; pilot-DAC; power consumption reduction; prototype measurement; size 0.18 mum; size 348 mum; size 7 mum; successive-approximation-register; switching phase; thermal noise; Arrays; Capacitors; Forward error correction; Image sensors; Random access memory; Switches; CMOS image sensor; SAR ADC; error correction;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2013.2244317
Filename :
6472261
Link To Document :
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