A 32 nm Embedded, Fully-Digital, Phase-Locked Low Dropout Regulator for Fine Grained Power Management in Digital Circuits

Author

Gangopadhyay, Samantak ; Somasekhar, Dinesh ; Tschanz, James W. ; Raychowdhury, Arijit

Author_Institution

Georgia Inst. of Technol., Atlanta, GA, USA

Volume

49

Issue

11

fYear

2014

fDate

Nov. 2014

Firstpage

2684

Lastpage

2693

Abstract

The need for fine-grained power management in digital ICs has led to the design and implementation of compact, scalable low-drop out regulators (LDOs) embedded deep within logic blocks. While analog LDOs have traditionally been used in digital ICs, the need for digitally implementable LDOs embedded in digital functional units for ultrafine grained power management is paramount. This paper presents a fully-digital, phase locked LDO implemented in 32 nm CMOS. The control model of the proposed design has been provided and limits of stability have been shown. Measurement results with a resistive load as well as a digital load exhibit peak current efficiency of 98%.

Keywords

CMOS digital integrated circuits; digital integrated circuits; low-power electronics; CMOS; digital IC; digital circuits; digital functional units; fine grained power management; logic blocks; phase locked LDO; phase-locked low dropout regulator; size 32 nm; Clocks; MOS devices; Regulators; Steady-state; Transient analysis; Voltage control; Voltage-controlled oscillators; Power management; digital LDO; digital design; low dropout regulator; low power design; phase lock loop; voltage regulators;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/JSSC.2014.2353798

Filename

6902825