DocumentCode :
765648
Title :
Influence of Sputtering Ar Pressure on Characteristics of Tb-Co Amorphous Thain Films
Author :
Takayama, S. ; Nihara, T. ; Kaneko, K. ; Sugita, Y.
Author_Institution :
Central Research Lab., Hitachi Ltd.
Volume :
1
Issue :
5
fYear :
1985
Firstpage :
650
Lastpage :
652
Abstract :
Amorphous Tb-Co films were prepared by diode RF sputtering under various Ar gas pressures and without applying a bias voltage, which is known to induce a large perpendicular magnetic anisotropy. The coercive force, saturation magnetization, and perpendicular anisotropy energy were measured as functions of the Ar pressure, and it was found that at higher pressures a perpendicular magnetic anisotropy was induced. Measurements of the film density and oxygen-content indicated that a large perpendicular magnetic anisotropy is induced for high oxygen contents and low atomic packing densities.
Keywords :
Amorphous materials; Argon; Atomic measurements; Coercive force; Diodes; Magnetic films; Perpendicular magnetic anisotropy; Radio frequency; Sputtering; Voltage;
fLanguage :
English
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
Publisher :
ieee
ISSN :
0882-4959
Type :
jour
DOI :
10.1109/TJMJ.1985.4548901
Filename :
4548901
Link To Document :
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