• DocumentCode
    765648
  • Title

    Influence of Sputtering Ar Pressure on Characteristics of Tb-Co Amorphous Thain Films

  • Author

    Takayama, S. ; Nihara, T. ; Kaneko, K. ; Sugita, Y.

  • Author_Institution
    Central Research Lab., Hitachi Ltd.
  • Volume
    1
  • Issue
    5
  • fYear
    1985
  • Firstpage
    650
  • Lastpage
    652
  • Abstract
    Amorphous Tb-Co films were prepared by diode RF sputtering under various Ar gas pressures and without applying a bias voltage, which is known to induce a large perpendicular magnetic anisotropy. The coercive force, saturation magnetization, and perpendicular anisotropy energy were measured as functions of the Ar pressure, and it was found that at higher pressures a perpendicular magnetic anisotropy was induced. Measurements of the film density and oxygen-content indicated that a large perpendicular magnetic anisotropy is induced for high oxygen contents and low atomic packing densities.
  • Keywords
    Amorphous materials; Argon; Atomic measurements; Coercive force; Diodes; Magnetic films; Perpendicular magnetic anisotropy; Radio frequency; Sputtering; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1985.4548901
  • Filename
    4548901