DocumentCode :
765717
Title :
The characteristics of large area processing plasmas
Author :
Park, Sea Eun ; Cho, Byung Ug ; Lee, Jae Koo ; Lee, Young Joon ; Yeom, Geun Young
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
Volume :
31
Issue :
4
fYear :
2003
Firstpage :
628
Lastpage :
637
Abstract :
In order to improve production efficiency, large-diameter wafer substrates (300-mm diameter) and large-area glass substrates (from 400 cm2 to 1 m2) have been adopted recently. As a result, the development of large and high-density plasma source has become essential. To investigate the discharge phenomenon in the chamber that consists of embedded antenna coil in the rectangular system (1020 ×830 ×437 mm), we have developed a two-dimensional fluid simulation model. In order to check our model, the results from our simulation have been compared with available experimental data. The comparison is generally in a good agreement with experiments. Depending on the current direction and powered method, the distribution of plasma parameters has many differences. In our simulation with a chamber larger than is usually used in other experiments, we examine three effects: the distance between antenna coils, structure in the chamber, and the depth of the chamber. The parameters, which affect nonuniformity, electron temperature, and others, can be explained in a manner similar to the inductively coupled plasma source with a cylindrical chamber. Our simulation results confirm that the embedded antenna coil system with a suitable environment can be extended by many antenna coils as a large-area plasma source.
Keywords :
antennas in plasma; plasma diagnostics; plasma materials processing; plasma simulation; plasma sources; 150 mm; 300 mm; antenna coils; chamber depth; chamber structure; discharge phenomenon; embedded antenna coil; embedded antenna coil system; high-density plasma source; inductively coupled plasma source; large area processing plasmas; large-area glass substrates; large-area plasma source; large-diameter wafer substrates; plasma parameter distributions; plasma simulation; production efficiency; rectangular system; two-dimensional fluid simulation model; Coils; Fault location; Glass; Plasma materials processing; Plasma properties; Plasma simulation; Plasma sources; Plasma temperature; Power system modeling; Production;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2003.815247
Filename :
1221841
Link To Document :
بازگشت