Title :
Design of a virtual LCR component meter
Author :
Evans, W.A. ; Ingersoll, T.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Wales, Swansea, UK
fDate :
3/1/1995 12:00:00 AM
Abstract :
The paper describes an LCR component meter employing both single-frequency and multifrequency testing of the component. The instrument departs from conventional component-meter practice, where a phase-sensitive detector is used to perform frequency convolution, to one based on the fast-Fourier-transform algorithm. Equivalent circuits of the component are computed at each frequency and displayed on a touch-sensitive window-managed display which forms part of a virtual instrument workstation
Keywords :
automatic test equipment; capacitors; electron device testing; fast Fourier transforms; inductors; resistors; virtual machines; component-meter practice; equivalent circuits; fast-Fourier-transform algorithm; frequency convolution; impedance scaling; multifrequency testing; phase-sensitive detector; signal detection; single-frequency testing; touch-sensitive window-managed display; virtual LCR component meter; virtual instrument workstation;
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
DOI :
10.1049/ip-smt:19951698