• DocumentCode
    76573
  • Title

    The Role of the Base Stack on the AC Performance of GaN Hot Electron Transistor

  • Author

    Soligo, Riccardo ; Chowdhury, Srabanti ; Gupta, Geetak ; Mishra, Umesh ; Saraniti, Marco

  • Author_Institution
    Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    36
  • Issue
    7
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    669
  • Lastpage
    671
  • Abstract
    In this letter, we provide guidelines for the design of the base stack of a GaN-base HET suitable for high-frequency operation, through full band cellular Monte Carlo device simulations. The experimental curves are matched by our model and the transmission coefficient through the base is confirmed to be 0.2. We found that upon moderate reduction of the base thickness and collector barrier height, the transmission coefficient reaches values well above 0.5, hence allowing current amplification. The cutoff frequency of the scaled devices is then calculated from the short circuit current gain and is found to be larger than 100 GHz. Moreover, the cutoff frequency is seen to increase roughly proportionally to the transmission coefficient. This result, and the calculation of the base capacitance, suggests that the cutoff frequency can be well described by the intrinsic delay time Cb/gm.
  • Keywords
    III-V semiconductors; Monte Carlo methods; gallium compounds; hot electron transistors; semiconductor device models; wide band gap semiconductors; GaN; GaN hot electron transistor; full band cellular Monte Carlo device simulations; high-frequency operation; transmission coefficient; Capacitance; Cutoff frequency; Delays; Electron devices; Gallium nitride; Layout; Monte Carlo methods; Cutoff Frequency; GaN; HET; High Frequency; Monte Carlo; Numerical Simulation; Terahertz; cutoff frequency; delay time; high frequency; numerical simulation; terahertz; transmission coefficient;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2436922
  • Filename
    7112128