DocumentCode :
765738
Title :
Study on the dual frequency capacitively coupled plasmas by the particle-in-cell/Monte Carlo method
Author :
Wakayama, Go ; Nanbu, Kenichi
Author_Institution :
Inst. of Fluid Sci., Tohoku Univ., Sendai, Japan
Volume :
31
Issue :
4
fYear :
2003
Firstpage :
638
Lastpage :
644
Abstract :
The dynamic structure of dual frequency (2/60 MHz) capacitively coupled plasmas (CCPs) in Ar (25 mtorr) are examined using the self-consistent particle-in-cell/Monte Carlo (PIC/MC) simulation. At first, the dependence of the discharge structure on wafer biasing conditions were investigated using one-dimensional computation. The results show that the plasma potential oscillates with the high frequency superposed on the low frequency. The amplitude of the high-frequency oscillation is modulated by the instantaneous potential of the low frequency biasing electrode. Furthermore, the axisymmetrical two-dimensional PIC/MC simulation is performed to investigate the influence of a geometric configuration of the reactor on the plasma structure.
Keywords :
Monte Carlo methods; high-frequency discharges; plasma diagnostics; plasma simulation; 2 MHz; 25 mtorr; 60 MHz; dual frequency capacitively coupled plasmas; dynamic structure; geometric configuration; instantaneous potential; ion-energy distribution; low frequency biasing electrode; one-dimensional computation; oscillation amplitude modulation; particle modeling; particle-in-cell/Monte Carlo method; plasma potential oscillation; plasma structure; processing plasma; reactor; self-consistent PIC MC simulation; superposed high-frequency oscillation; wafer biasing conditions; Argon; Computational modeling; Etching; Frequency; Plasma applications; Plasma density; Plasma materials processing; Plasma properties; Plasma simulation; Plasma sources;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2003.815471
Filename :
1221843
Link To Document :
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