• DocumentCode
    765786
  • Title

    Determination of M-effect diffusion parameters in high breaking capacity fuses

  • Author

    Beaujean, D.A. ; Jayne, M.G. ; Newbery, P.G.

  • Author_Institution
    Dept. of Electron. & Inf. Technol., Glamorgan Univ., Pontypridd, UK
  • Volume
    142
  • Issue
    2
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    162
  • Lastpage
    168
  • Abstract
    The development of software models to simulate M-effect action in high breaking capacity fuses requires a knowledge of the diffusion process which occur between the M-effect alloy and the fuse element material during fuse operation. The authors describe the experimental determination of the diffusion parameters which dictate the rate of M-effect action, and their variation with temperatures. Diffusion data are obtained from fuse elements which have heat treated under both constant temperature and constant current conditions, and analysed using optical and scanning electron microscope techniques. Measurements from the micrographs enable both the diffusion coefficient and the activation energy of the silver-tin system to be determined. The values of the diffusion parameters so obtained are used in an electrical model for the M-effect, based on the use of analogue circuit simulation software package, to predict fuse temperature rise and the rate M-effect action, and the results obtained compared with experimental values
  • Keywords
    diffusion; digital simulation; electric fuses; electrical engineering computing; silver alloys; testing; tin alloys; Ag-Sn; Ag-Sn system; M-effect; M-effect action; M-effect alloy; M-effect diffusion parameters; activation energy; analogue circuit simulation; constant current; constant temperature; diffusion coefficient; fuse operation; fuse temperature rise; high breaking capacity fuses; micrographs; optical microscope; scanning electron microscope; software models; software package;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:19951595
  • Filename
    376932