• DocumentCode
    765896
  • Title

    Improving microwave imaging by enhancing diffraction tomography

  • Author

    Murch, R.D. ; Chan, T.K.K.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
  • Volume
    44
  • Issue
    3
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    379
  • Lastpage
    388
  • Abstract
    In this paper, a technique for enhancing the reconstruction quality of diffraction tomography for microwave imaging is presented. The technique invokes the WKB approximation in conjunction with utilizing measurement data at more than one frequency to overcome some of the limitations of diffraction tomography. The resulting formulation has a mathematical interpretation which leads to some interesting insights into the limitations of diffraction tomography. Numerical implementation of the technique is also described and actual simulation results using this implementation for a variety of two-dimensional (2-D) objects are provided. These show that indeed significant improvements over conventional diffraction tomography are possible with our enhanced technique
  • Keywords
    image reconstruction; microwave imaging; object detection; tomography; WKB approximation; diffraction tomography; microwave imaging; reconstruction quality; two-dimensional objects; Diffraction; Frequency measurement; Geophysical measurements; Image reconstruction; Medical simulation; Microwave devices; Microwave imaging; Microwave theory and techniques; Scattering; Tomography;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.486147
  • Filename
    486147