DocumentCode :
765896
Title :
Improving microwave imaging by enhancing diffraction tomography
Author :
Murch, R.D. ; Chan, T.K.K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
Volume :
44
Issue :
3
fYear :
1996
fDate :
3/1/1996 12:00:00 AM
Firstpage :
379
Lastpage :
388
Abstract :
In this paper, a technique for enhancing the reconstruction quality of diffraction tomography for microwave imaging is presented. The technique invokes the WKB approximation in conjunction with utilizing measurement data at more than one frequency to overcome some of the limitations of diffraction tomography. The resulting formulation has a mathematical interpretation which leads to some interesting insights into the limitations of diffraction tomography. Numerical implementation of the technique is also described and actual simulation results using this implementation for a variety of two-dimensional (2-D) objects are provided. These show that indeed significant improvements over conventional diffraction tomography are possible with our enhanced technique
Keywords :
image reconstruction; microwave imaging; object detection; tomography; WKB approximation; diffraction tomography; microwave imaging; reconstruction quality; two-dimensional objects; Diffraction; Frequency measurement; Geophysical measurements; Image reconstruction; Medical simulation; Microwave devices; Microwave imaging; Microwave theory and techniques; Scattering; Tomography;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.486147
Filename :
486147
Link To Document :
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