Title :
Properties of FeAl Soft Magnetic Thin Film
Author :
Matsumoto, M. ; Morisako, A.
Author_Institution :
Shinshu Univ., Faculty of Engng., Nagano.
Abstract :
The magnetic properties of FeAl alloy films, deposited by evaporation in a magnetic field, were studied to explore the possibility of their use in place of Permalloy in thin film recording heads. For Al concentrations of 20 to 30 at% or less, Ms values were large compared with those for Permalloy. Resistivity increased monotonically with Al concentration, while the hardness reached a maximum of Hv = 1300 at 11 at% Al. It is concluded that such FeAl films may serve in place of Permalloy in thin-film heads.
Keywords :
Amorphous materials; Conductivity; Magnetic fields; Magnetic films; Magnetic heads; Magnetic materials; Magnetic properties; Soft magnetic materials; Substrates; Transistors;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1985.4548927
