Title :
Enhancement in Magnetic Anisotropy for hcp-Structured Co Alloy Thin Films Through Pt Addition
Author :
Shen, W.K. ; Das, Anirban ; Racine, Michael ; Cheng, Randy ; Judy, Jack H. ; Wang, Jian-Ping
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ.
Abstract :
The addition effects of Pt in the (0002) Ru underlayer were studied. It was found that the lattice parameter can be tuned as desired through Pt addition in a (0002)-oriented Ru layer. The out-of-plane and in-plane lattice parameter of the RuPt can be increased by 2.3% and 0.44%, respectively. No phase segregation was apparently observed in RuPt films under these process conditions even with a very high Pt content (39%). The RuPt layer thus provides a good template layer to study the Pt addition effects in (0002)-textured hcp Co alloy perpendicular media with a very wide range of Pt content. CoCrPt-SiO2 films were deposited with a Pt addition level varying from 15% to 40% on an optimally designed RuPt underlayer. The magnetic results showed that Hk,Hc,Ku reached a plateau at about 19%-23% Pt content. The maximum values for H k,Hc, and Ku are 16.0 kOe, 6.6 kOe, and 3.1times106 erg/cm3, respectively
Keywords :
X-ray diffraction; chromium alloys; cobalt alloys; magnetic thin films; perpendicular magnetic anisotropy; platinum alloys; ruthenium alloys; silicon compounds; CoCrPt-SiO2; Pt addition; RuPt; RuPt underlayer; X-ray diffraction; cobalt alloy; hcp-structured; magnetic anisotropy enhancement; magnetic thin films; perpendicular media; Anisotropic magnetoresistance; Cobalt alloys; Lattices; Magnetic anisotropy; Magnetic films; Manganese alloys; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Platinum alloys; X-ray scattering; Co alloy; CoCrPt–SiO; Pt addition; Ru underlayer; RuPt underlayer; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.878422
