DocumentCode :
765953
Title :
Accurate small-signal modeling of HFET´s for millimeter-wave applications
Author :
Rorsman, Niklas ; Garcia, Mikael ; Karlsson, Christer ; Zirath, Herbert
Author_Institution :
Dept. of Microwave Technol., Chalmers Univ. of Technol., Goteborg, Sweden
Volume :
44
Issue :
3
fYear :
1996
fDate :
3/1/1996 12:00:00 AM
Firstpage :
432
Lastpage :
437
Abstract :
In this paper we discuss the small-signal modeling of HFET´s at millimeter-wave frequencies. A new and iterative method is used to extract the parasitic components. This method allows calculation of a π-network to model the heterojunction field-effect transistor (HFET) pads, thus extending the validity of the model to higher frequencies. Formulas are derived to translate this π-network into a transmission line. A new and general cold field-effect transistor (FET) equivalent circuit, including a Schottky series resistance, is used to extract the parasitic resistances and inductances. Finally, a new and compact set of analytical equations for calculation of the intrinsic parameters is presented. The real part of Y12 is accounted for in these equations and its modeling is discussed. The accounting of Re(Y12 ) improves the S-parameter modeling. Model parameters are extracted for an InAlAs/InGaAs/InP HFET from measured S-parameters up to 50 GHz, and the validity of the model is evaluated by comparison with measured data at 75-110 GHz
Keywords :
S-parameters; equivalent circuits; iterative methods; junction gate field effect transistors; millimetre wave field effect transistors; semiconductor device models; π-network; 75 to 110 GHz; HFET; InAlAs-InGaAs-InP; S-parameters; Schottky series resistance; cold field-effect transistor; equivalent circuit; heterojunction field-effect transistor; iterative method; millimeter-wave applications; parasitic inductance; parasitic resistance; small-signal modeling; transmission line; Equations; FETs; Frequency; HEMTs; Heterojunctions; Iterative methods; MODFETs; Millimeter wave technology; Millimeter wave transistors; Scattering parameters;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.486152
Filename :
486152
Link To Document :
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