Title :
Probing the Magnetization Reversal of Microstructured Permalloy Cross by Planar Hall Measurement and Magnetic Force Microscopy
Author :
Chang, Y.C. ; Chang, C.C. ; Wu, J.C. ; Wei, Z.H. ; Lai, M.F. ; Chang, C.R.
Author_Institution :
Nat. Changhua Univ. of Educ.
Abstract :
A local magnetization reversal of Permalloy cross has been studied by using magnetoresistance measurement and magnetic force microscope. An extraordinary change of the transverse voltage correlated with the planar Hall Effect was presented and evidenced by a series of MFM images which indicates that the rotation of magnetization within the joint area contributes to the significant voltage alteration
Keywords :
Hall effect devices; Permalloy; magnetic force microscopy; magnetic recording; magnetisation reversal; magnetoresistance; Hall effect devices; MFM images; magnetic force microscopy; magnetic recording; magnetization reversal; magnetoresistance measurement; microstructured permalloy cross; planar Hall measurement; Anisotropic magnetoresistance; Current measurement; Force measurement; Magnetic anisotropy; Magnetic domain walls; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetization reversal; Voltage measurement; Hall effect devices; magnetic force microscopy (MFM); magnetic recording; magnetoresistance;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.878421
