Title :
Photoinduced refractive-index changes in TiO2-doped silica optical waveguides on silicon substrate
Author :
Hibino, Y. ; Abe, M. ; Kominato, T. ; Ohmori, Y.
Author_Institution :
NTT Opto-Electron. Labs., Ibaraki, Japan
Abstract :
For the first time, refractive-index changes are described which are due to laser irradiation in a Mach-Zehnder interferometer composed of TiO2-doped silica optical waveguides on an Si substrate. A maximum refractive-index change of about 1.0*10-5 is obtained around 1.5 mu m at an Ar+ laser throughput power of 2.1 W and an irradiation time of 1 h even though the concentration of TiO2 is very low (about 0.3 mol.%).
Keywords :
integrated optics; light interferometers; optical waveguides; refractive index; silicon compounds; titanium compounds; 1 hr; 1.5 micron; 2.1 W; Ar + laser; Mach-Zehnder interferometer; Si substrate; SiO 2:TiO 2; TiO 2-doped silica; laser irradiation; optical waveguides; photoinduced refractive-index changes;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19911418
