• DocumentCode
    766078
  • Title

    FDFD full-wave analysis and modeling of dielectric and metallic losses of CPW short circuits

  • Author

    Klingbeil, H. ; Beilenhoff, K. ; Hartnagel, H.L.

  • Author_Institution
    Inst. fur Hochfrequenztech., Darmstadt, Germany
  • Volume
    44
  • Issue
    3
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    485
  • Lastpage
    487
  • Abstract
    A finite-difference method in the frequency domain (FDFD) is used to analyze the influence of lossy materials on the scattering behavior of CPW short ends. Not only dielectric losses but also realistic metallic losses are taken into account for the first time in an FDFD method. Both, the numerical results for the three-dimensional structure and the complex propagation constants of the homogeneous waveguide are presented. These are compared with those yielded by an analytical method and shown to be of good agreement. Finally, a simple model is presented, which describes the CPW short end with good accuracy
  • Keywords
    coplanar waveguides; dielectric losses; finite difference methods; frequency-domain analysis; losses; waveguide theory; CPW short circuits; CPW short end; FDFD full-wave analysis; complex propagation constants; dielectric losses; finite-difference method; frequency domain method; homogeneous waveguide; lossy materials; metallic losses; modeling; scattering behavior; three-dimensional structure; Circuits; Conductivity; Conductors; Coplanar waveguides; Dielectric losses; Finite difference methods; Frequency domain analysis; MMICs; Metallization; Scattering;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.486165
  • Filename
    486165