CPP-GMR Films With Oblique Deposition

Author

Hoshiya, Hiroyuki ; Hoshino, Katsumi

Author_Institution

Central Res. Lab., Hitachi, Ltd

Volume

42

Issue

10

fYear

2006

Firstpage

3023

Lastpage

3024

Abstract

We investigated current perpendicular-to-the-plane giant magnetolresistive (CPP-GMR) films deposited with oblique incidence. The obliquely deposited free layer increased the MR ratio and the RA slightly, even though small asymmetric distribution of tilted angles was seen in our cross-sectional observation. In contrast, the MR ratio decreased with the obliquely deposited Cu spacer. Therefore, oblique deposition for CPP-GMR films is an effective method for increasing electron scattering at the obliquely deposited magnetic layer

Keywords

copper; giant magnetoresistance; magnetic thin films; CPP-GMR films; Cu; MR ratio; current perpendicular-to-the-plane giant magnetoresistive films; electron scattering; oblique deposition; oblique incidence; obliquely deposited magnetic layer; Current measurement; Electrical resistance measurement; Electrons; Giant magnetoresistance; Grain boundaries; Magnetic field measurement; Magnetic films; Magnetic materials; Scattering; Substrates; Columnar grains; current perpendicular-to-the-plane giant magnetoresistive (CPP-GMR); grain boundary; oblique deposition;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2006.878410

Filename

1704517