DocumentCode :
766215
Title :
CPP-GMR Films With Oblique Deposition
Author :
Hoshiya, Hiroyuki ; Hoshino, Katsumi
Author_Institution :
Central Res. Lab., Hitachi, Ltd
Volume :
42
Issue :
10
fYear :
2006
Firstpage :
3023
Lastpage :
3024
Abstract :
We investigated current perpendicular-to-the-plane giant magnetolresistive (CPP-GMR) films deposited with oblique incidence. The obliquely deposited free layer increased the MR ratio and the RA slightly, even though small asymmetric distribution of tilted angles was seen in our cross-sectional observation. In contrast, the MR ratio decreased with the obliquely deposited Cu spacer. Therefore, oblique deposition for CPP-GMR films is an effective method for increasing electron scattering at the obliquely deposited magnetic layer
Keywords :
copper; giant magnetoresistance; magnetic thin films; CPP-GMR films; Cu; MR ratio; current perpendicular-to-the-plane giant magnetoresistive films; electron scattering; oblique deposition; oblique incidence; obliquely deposited magnetic layer; Current measurement; Electrical resistance measurement; Electrons; Giant magnetoresistance; Grain boundaries; Magnetic field measurement; Magnetic films; Magnetic materials; Scattering; Substrates; Columnar grains; current perpendicular-to-the-plane giant magnetoresistive (CPP-GMR); grain boundary; oblique deposition;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2006.878410
Filename :
1704517
Link To Document :
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